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design for testability

  • 网络可测性设计；可测试性设计；可测试性程式

design for testabilitydesign for testability
网络释义

design for testability

可测性设计

2、产品可测性设计（Design for Testability）。3、产品生产测试技术平台的研究、开发和推广。

可测试性设计

缩略语 DFT 的查询结果 ... 可测试性设计 design-for-testability 可测试性设计 design for testability 可测性 design-for-test ...

可测试性程式

材料科学专... ... design automation conference 自动设计学术研讨会 design for testability 可测试性程式 design kit 设计套组 ...

额外地把可测性电路设计

通常我们在设计芯片的同时，可以根据芯片本身的特征，额外地把可测性电路设计（Design For TESTability）在芯片里。谈到 …

易测试性的设计

UML软件工程组织 ... exploratory testing 探索性测试 Design for testability 易测试性的设计 Design by Contract 合约设计 ...

易测试性设计

lecture ... Design for Testability( 易测试性设计) Low-Power IC Design( 低功率积体电路设计) ...

可测试性程序

电子电工英文词汇翻译d-二极管-直流电... ... Design Entry 设计输入 design for testability 可测试性程序 design kit 设计套组 ...

例句：
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Design for minimum cost at the system level, including your own engineering effort. Design for testability and manufacturability.
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As a new method of design for testability build-in self-test can prominently improve the testability of the circuits.
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Boundary-scan technology (BST) is a new and effective way of test and design-for-testability ( DFT ) for VLSI circuits.
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DFT (design for testability) method tries to resolve the test problem in the early process of IC design.
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Design for Testability of a Novel High-Speed DCT in VLSI
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